Design for testing: Revision history


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  • curprev 02:3502:35, 14 October 2005 66.90.152.107 talk 1,950 bytes +1,500 Scan chains aren't added solely for manufacturing test; they're also quite useful for debug. This topic could also benefit from more links to (possibly yet-to-be-written) logic design topics. undo

20 September 2005

7 September 2005

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