Talk:Automatic test pattern generation: Difference between revisions

Revision as of 04:22, 22 October 2007

Latest revision as of 12:17, 26 January 2024

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=== EDASeeAlso ===

[[Template:EDASeeAlso]]

To the EDASeeAlso template editor:

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Additionally, there is generic use of this template across several EDA articles. Generic wording to a paid site is very close, if not SPAM. I simply ask that the template not be used so the community can improve the corresponding text. I also believe that using this template, however sincere in purpose, is SPAM and against Wiki guidelines. Please remove. There are plenty of ATPG that are available w/o cost. <small>—Preceding [[Wikipedia:Signatures|unsigned]] comment added by [[User:TeamX|TeamX]] ([[User talk:TeamX|talk]] • [[Special:Contributions/TeamX|contribs]]) 04:20, 22 October 2007 (UTC)</small><!-- Template:Unsigned --> <!--Autosigned by SineBot-->

Hi! A few points

:An encyclopedia article should point to the primary references, though pointing to the best free ones as well is great. The primary references are in fact the IEEE and ACM. Note that the International Test Conference is published by the IEEE [http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000753 Proceedings of ITC], as is the VLSI test conference, and these are fee-based. It is not clear that substituting one fee-based reference for another helps your objection.

:If you remove the template, and add conferences, please make them linkable. This will make it much easier for users to get the articles.

:It's considered bad form to add your entry to the top of a list.

:This is wikipedia, after all. You can SUBST the template text, (type <nowiki> {{subst:EDASeeAlso}} </nowiki>). This substitutes the text, not macro's it, so then you can edit it to your heart's content. In fact, you can do this on every page where the template is used. Then everything will depend on whether users think you made it better or worse. [[User:LouScheffer|LouScheffer]] 21:06, 22 October 2007 (UTC)

=== clarify ===

:: Can someone reword this:

"any logic value observed at one or more of the circuit's primary outputs differs between the original design and the design with the fault. "

what does "differs between" mean? (I am native speaker btw!)

I thought the fault officially exists when the output matches the contrived faulty model?

i.e.: if it doesn't match the faulty model, then it's not officially a fault (except maybe the test is faulty!) <span style="font-size: smaller;" class="autosigned">—Preceding [[Wikipedia:Signatures|unsigned]] comment added by [[Special:Contributions/87.113.116.33|87.113.116.33]] ([[User talk:87.113.116.33|talk]]) 14:47, 24 April 2009 (UTC)</span><!-- Template:UnsignedIP --> <!--Autosigned by SineBot-->

: I agree that is confusing. I reworded that phrase, as requested.[http://en.wikipedia.org/w/index.php?title=Automatic_test_pattern_generation&action=historysubmit&diff=446992329&oldid=446982553]

: Feel free to further improve that text and the rest of the article. --[[User:DavidCary|DavidCary]] ([[User talk:DavidCary|talk]]) 16:54, 27 August 2011 (UTC)

this bit looks like wonky english as well:

"Fault activation establishes a signal value at the fault model site that is opposite of the value produced by the fault model"

Fault sensitisation means you might use Boundary Scan JTAG to set permanent inputs as a test pattern, and pass them through, doesn't it? Then you know what the output is supposed to be if it's faulty or if it's "no fault detected" (as opposed to "unfaulty"... 'cos you're never guaranteed are you?!)

== Automatic? Generation? ==

I'd be nice if this article explained where the terms ''automatic'' and ''generation'' in ''automatic test pattern generation'' stem from and if this article compared ATPG to ''non-automatic'' test pattern generation (if there is any). Thanks, --[[User:Abdull|Abdull]] ([[User talk:Abdull|talk]]) 23:07, 9 February 2010 (UTC)