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→Spectral ratio methodTonn, R. 1991. The determination of seismic quality factors Q from VSP data: A comparison of different computational methods. Geophys. Prosp. 39, 1-27.: bias in Q estimates for frequency dependent Q |
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In [[reflection seismology]], the '''anelastic attenuation factor'''
==Quality factor, ''Q''==
''Q'' is defined as
:<math>Q = 2{\pi}\left ( \frac{E}{{\delta}E} \right )</math>
where <math>\frac{{\delta}E}{E}</math> is the fraction of energy lost per cycle.<ref>Sheriff, R. E., Geldart, L. P., (1995), 2nd Edition. ''Exploration Seismology''. Cambridge University Press.</ref>
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==Measurement of Q==
===Spectral ratio method===
<ref>Tonn, R. 1991. The determination of seismic quality factors Q from VSP data: A comparison of different computational methods. ''Geophys. Prosp.'' 39, 1-27.</ref> The geometry of a zero-offset vertical seismic profile (VSP) makes it an ideal survey to use for the calculation of Q using the spectral ratio method. This is because of the coincident raypaths that traverse a given rock layer, ensuring that the only path difference between two reflected waves (one from the top of the interval and one from the bottom) is the interval of interest. Stacked surface [[seismic reflection]] traces would offer similar signal-to-noise ratio over a much larger area but cannot be used with this method because every sample represents a different raypath and therefore will have experienced different attenuation effects.<ref>Dasgupta, R., & Clark, R.A. (1998) Estimation of Q from surface seismic reflection data. ''Geophysics'', '''63''', 2120-2128</ref>
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* [[Acoustic attenuation]]
* [[Attenuation]]
* [[Q models (seismology)]]
* [[Kolsky Q models]]
* [[Azimi Q models]]
==References==
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