Design Automation and Test in Europe: Difference between revisions

Revision as of 04:52, 16 June 2025

Latest revision as of 05:16, 16 June 2025

(2 intermediate revisions by the same user not shown)

Line 1:

{{Infobox recurring event

| logo = Design, Automation and Test in Europe Conference.png

| name = DATE, Design Automation and Test in Europe

| next = [https://www.date-conference.com DATE2025] in [[Lyon, France]]

Line 13:

}}

'''Design, Automation & Test in Europe''', or '''DATE''' is a yearly conference on the topic of [[electronic design automation]], typically held in March or April, alternating between France and Germany.<ref>{{Cite book|title=Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE 2022)|date=2022|publisher=European Design and Automation Association|isbn=978-3-9819263-6-1|oclc=1327747814}}</ref><ref>{{Cite web|url=https://dl.acm.org/conference/date|title=Design, Automation, and Test in Europe proceedings 1998-2023 &#124; |website=Association for Computing Machinery Digital Library}}</ref> DATE is a combination of a [[Academic conference|website=dltechnical conference]] and a small [[trade show]].acm It was formed in 1998 as a merger of EDAC, ETC, Euro-ASIC, and Euro-DAC.org/<ref>{{Cite book|title=Proceedings of the conference/ on Design, automation, and test in Europe (DATE 1998)|date=1998|publisher=IEEE Computer Society|isbn=978-0-8186-8359-6|oclc=1112536591}}</ref> It is sponsored by the [[SIGDA]] of the [[Association for Computing Machinery]], the [[Electronic System Design Alliance]], the European Design and Automation Association (EDAA),<ref>{{Cite web|url=https://www.edaa.com|title=European Design and Automation Association &#124; home page|website=www.edaa.com}}</ref> and the [[IEEE Council on Electronic Design Automation]] (CEDA). Technical co-sponsors include [[Association for Computing Machinery#Special Interest Groups|ACM SIGBED]], the [[IEEE Solid-State Circuits Society]] (SSCS), [[IFIP]], and the [[Institution of Engineering and Technology]] (IET).

'''Design, Automation & Test in Europe''', or '''DATE''' is a yearly conference on the topic of [[electronic design automation]]. It is typically held in March or April of each year, alternating between France and Germany.<ref>{{Cite book|url=https://worldcat.org/title/1327747814|title=Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE 2022)

|date=2022|publisher=European Design and Automation Association|isbn=978-3-9819263-6-1|oclc=1327747814}}</ref><ref>{{Cite web|url=https://dl.acm.org/conference/date|title=Design, Automation, and Test in Europe proceedings 1998-2023 &#124; Association for Computing Machinery Digital Library|website=dl.acm.org/conference/date}}</ref> It is sponsored by the [[SIGDA]] of the [[Association for Computing Machinery]], the [[Electronic System Design Alliance]], the European Design and Automation Association (EDAA),<ref>{{Cite web|url=https://www.edaa.com|title=European Design and Automation Association &#124; home page|website=www.edaa.com}}</ref> and the [[IEEE Council on Electronic Design Automation]] (CEDA).

Technical co-sponsors include [[Association for Computing Machinery#Special Interest Groups|ACM SIGBED]], the [[IEEE Solid-State Circuits Society]] (SSCS), [[IFIP]], and the [[Institution of Engineering and Technology]] (IET).

== Areas of Submissionsubmission ==

DATE is a combination of a [[Academic conference|technical conference]] and a small [[trade show]]. It was formed in 1998 as a merger of EDAC, ETC, Euro-ASIC, and Euro-DAC.<ref>{{Cite book|url=https://worldcat.org/title/1112536591|title=Proceedings of the conference on Design, automation, and test in Europe (DATE 1998)

|date=1998|publisher=IEEE Computer Society|isbn=978-0-8186-8359-6|oclc=1112536591}}</ref>

== Areas of Submission ==

The DATE conference invites research papers in many areas related to [[electronic design automation]]. These topics are grouped into four main tracks: design methods, applications, testing, and embedded systems.<ref name="cfp">[https://www.date-conference.com/call-for-papers DATE Conference – Call for Papers]</ref>

'''Track D:<ref name="tpc-d">[https://www.date-conference.com/tpc Track D – DATE Technical Program Committee]</ref> [https://en.wikipedia.org/wiki/Design_methods Design Methods and Tools]''' covers research on how to build better design tools and methods. Topics include high-level synthesis, system simulation, formal verification, low-power and secure design, reconfigurable systems, and new ideas like quantum computing and approximate computing.

'''Track A:<ref name="tpc-a">[https://www.date-conference.com/tpc Track A – DATE Technical Program Committee]</ref> [https://en.wikipedia.org/wiki/Design_computing Application Design]'''focuses on real-world examples. It includes designs for smart energy systems, secure and autonomous systems, artificial intelligence, and new technologies used in practical ways.

'''Track T:<ref name="tpc-t">[https://www.date-conference.com/tpc Track T – DATE Technical Program Committee]</ref> [https://en.wikipedia.org/wiki/Dependability Test and Dependability]''' is about testing and reliability. It includes fault detection, circuit testing, secure system validation, and ways to make sure systems work even when there are errors.

'''Track E:<ref name="tpc-e">[https://www.date-conference.com/tpc Track E – DATE Technical Program Committee]</ref> [https://en.wikipedia.org/wiki/Embedded_system Embedded Systems Design]''' includes software and hardware for embedded and cyber-physical systems. Topics cover real-time systems, secure systems, software tools, and using machine learning in embedded devices.

The DATE conference invites research papers in many areas related to [[electronic design automation]]. These topics are grouped into four main tracks: design methods, applications, testing, and embedded systems.:<ref name="cfp">[https://www.date-conference.com/call-for-papers DATE Conference – Call for Papers]</ref>

* '''Track D:<ref name="tpc-d">[https://www.date-conference.com/tpc Track D – DATE Technical Program Committee]</ref> [https://en.wikipedia.org/wiki/Design_methods[Design methods|Design Methods and Tools]]''' covers research on how to build better design tools and methods. Topics include high-level synthesis, system simulation, formal verification, low-power and secure design, reconfigurable systems, and new ideas like quantum computing and approximate computing.

* '''Track A:<ref name="tpc-a">[https://www.date-conference.com/tpc Track A – DATE Technical Program Committee]</ref> [https://en.wikipedia.org/wiki/Design_computing[Design computing|Application Design]]''' focuses on real-world examples. It includes designs for smart energy systems, secure and autonomous systems, artificial intelligence, and new technologies used in practical ways.

* '''Track T:<ref name="tpc-t">[https://www.date-conference.com/tpc Track T – DATE Technical Program Committee]</ref> [https://en.wikipedia.org/wiki/[Dependability |Test and Dependability]]''' is about testing and reliability. It includes fault detection, circuit testing, secure system validation, and ways to make sure systems work even when there are errors.

* '''Track E:<ref name="tpc-e">[https://www.date-conference.com/tpc Track E – DATE Technical Program Committee]</ref> [https://en.wikipedia.org/wiki/Embedded_system[Embedded system|Embedded Systems Design]]''' includes software and hardware for embedded and cyber-physical systems. Topics cover real-time systems, secure systems, software tools, and using machine learning in embedded devices.

Each track has several specific topics. Authors can choose the one that fits their work. All papers are peer-reviewed and must present original and useful research.

== Young People Programme ==

The DATE conference hosts the '''Young People Programme''', an initiative aimed at supporting early-career researchers and strengthening academic-industry connections. First introduced in 2019, the program offers career development resources for master’smaster's students, PhD candidates, and postdoctoral researchers. It also provides a platform forintroduces companies and universities to engage with emergingpotential talentemployees. The programme includes networking events, mentorship opportunities, and recruiting activities to help participants explore career paths and build professional relationships.<ref name="ypp">[https://www.date-conference.com/young-people-programme DATE Conference – Young People Programme]</ref>

== Conference Archivearchive ==

The following table lists past editions of the DATE (Design, Automation and Test in Europe) conference, including the host cities and years. A full archive of events and proceedings is available on the official DATE website.<ref name="archive">[https://www.date-conference.com/archive DATE Conference Archive]</ref> Additional bibliographic information is available through the DBLP computer science bibliography.<ref name="dblp">[https://dblp.org/db/conf/date/index.html DBLP – DATE Conference Proceedings Archive]</ref> Proceedings for each year are accessible via IEEE Xplore.<ref name="ieee">[https://ieeexplore.ieee.org/Xplore/home.jsp IEEE Xplore Digital Library]</ref>

{| class="wikitable sortable collapsible"

! Year !! Location !! Proceedings

|-

| 2025 || Lyon, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/10992638/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2024 || Valencia, Spain || <ref>[https://ieeexplore.ieee.org/xpl/conhome/10546498/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2023 || Antwerp, Belgium || <ref>[https://ieeexplore.ieee.org/xpl/conhome/10136870/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2022 || Antwerp, Belgium || <ref>[https://ieeexplore.ieee.org/xpl/conhome/9774496/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2021 || Grenoble, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/9473901/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2020 || Grenoble, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/9112295/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2019 || Florence, Italy || <ref>[https://ieeexplore.ieee.org/xpl/conhome/8704855/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2018 || Dresden, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/8337149/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2017 || Lausanne, Switzerland || <ref>[https://ieeexplore.ieee.org/xpl/conhome/7919927/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2016 || Dresden, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/7454909/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2015 || Grenoble, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/7076741/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2014 || Dresden, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/6784162/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2013 || Grenoble, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/6507370/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2012 || Dresden, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/6171057/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2011 || Grenoble, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/5754459/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2010 || Dresden, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/5450668/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2009 || Nice, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/4926138/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2008 || Munich, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/4475437/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2007 || Nice, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/4211748/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2006 || Munich, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/11014/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2005 || Munich, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/9609/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2004 || Paris, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/8959/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2003 || Munich, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/8443/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2002 || Paris, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/7834/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2001 || Munich, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/7307/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 2000 || Paris, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/6761/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 1999 || Munich, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/6133/proceeding IEEE Xplore]</ref name="ieee" />

|-

| 1998 || Paris, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/5270/proceeding IEEE Xplore]</ref name="ieee" />

|}

Line 106 ⟶ 96:

== See also ==

* [[electronicElectronic design automation]]

* [[:Category:Electronic design automation software|]] (EDA Softwaresoftware Category]]category)

* [[Design Automation Conference]]

* [[International Conference on Computer-Aided Design]]

* [[Asia and South Pacific Design Automation Conference]]

* [[Symposia on VLSI Technology and Circuits]]

* [https://en.wikipedia.org/wiki/Design_methods Design methods] – Related to Track D: Design Methods and Tools

* [https://en.wikipedia.org/wiki/Design_computing Design computing] – Related to Track A: Application Design

* [https://en.wikipedia.org/wiki/Dependability Dependability] – Related to Track T: Test and Dependability

* [https://en.wikipedia.org/wiki/Embedded_system Embedded systems] – Related to Track E: Embedded Systems Design

==References==