Design Automation and Test in Europe: Difference between revisions

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{{Infobox recurring event

{{Multiple issues|

| logo = Design, Automation and Test in Europe Conference.png

{{primary sources|date=September 2011}}

| name = DATE, Design Automation and Test in Europe

{{More references|date=July 2020}}

| next = [https://www.date-conference.com DATE2025] in [[Lyon, France]]

{{Bare|date=October 2020}}

| website = [https://www.date-conference.com DATE]

| area = [[Electronic design automation]]

| frequency = Annual

| status = Active

| years_active = {{age|1998|02|25}}

| founded = {{Start date and age|1998|02}} in [[Paris, France]]

| participants = 1200

| sponsors = [[Association for Computing Machinery|ACM]] [[Special Interest Group on Design Automation]] (SIGDA), the [[Electronic System Design Alliance]] (ESDA), the European Design and Automation Association (EDAA), and the [[IEEE Council on Electronic Design Automation]] (CEDA)

}}

{{Automation}}

'''Design, Automation & Test in Europe''', or '''DATE''' is a yearly conference on the topic of [[electronic design automation]]. It is, typically held in March or April of each year, alternating between France and Germany.<ref>Date{{Cite book|title=Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (n.dDATE 2022).|date=2022|publisher=European Design and Automation Association|isbn=978-3-9819263-6-1|oclc=1327747814}}</ref><ref>{{Cite web|url=https://wwwdl.acm.org/conference/date|title=Design, Automation, and Test in Europe proceedings 1998-2023|website=Association for Computing Machinery Digital Library}}</ref> DATE is a combination of a [[Academic conference|technical conference]] and a small [[trade show]].com/#:~:text It was formed in 1998 as a merger of EDAC, ETC, Euro-ASIC, and Euro-DAC.<ref>{{Cite book|title=The%20Design%2C%20Automation%2C%20and%20TestProceedings of the conference on Design, automation, and test in%20April%20and%20May%202020. Europe (DATE 1998)|date=1998|publisher=IEEE Computer Society|isbn=978-0-8186-8359-6|oclc=1112536591}}</ref> It is sponsored by the [[SIGDA]] of the [[Association for Computing Machinery]], the [[EDAElectronic System Design ConsortiumAlliance]], the [[European Design and Automation Association]] (EDAA),<ref>{{Cite the web|url=https://www.edaa.com|title=European Electronic ChipsDesign and SystemsAutomation DesignAssociation Initiative&#124; (ECSI),home page|website=www.edaa.com}}</ref> and the [[IEEE ComputerCouncil Societyon Electronic Design Automation]] (TTTCCEDA). Technical co-sponsors include [[Association for Computing Machinery#Special Interest Groups|ACM SIGBED]], the [[IEEE CouncilSolid-State onCircuits Electronic Design AutomationSociety]] (CEDASSCS), [[IFIP]], and the [[IEEEInstitution Roboticsof Engineering and Automation SocietyTechnology]] (RASIET).

Technical co-sponsors include [[Association for Computing Machinery#Special Interest Groups|ACM SIGBED]], the [[IEEE Solid-State Circuits Society]] (SSCS), [[IFIP]], and the [[Institution of Engineering and Technology]] (IET).

== Areas of submission ==

DATE is a combination of a [[trade show]] and a [[Academic conference|technical conference]].

The DATE conference invites research papers in many areas related to [[electronic design automation]]. These topics are grouped into four main tracks: design methods, applications, testing, and embedded systems:<ref name="cfp">[https://www.date-conference.com/call-for-papers DATE Conference – Call for Papers]</ref>

== See also ==

* '''Track D:<ref name="tpc-d">[https://www.date-conference.com/tpc Track D – DATE Technical Program Committee]</ref> [[Design methods|Design Methods and Tools]]''' covers research on how to build better design tools and methods. Topics include high-level synthesis, system simulation, formal verification, low-power and secure design, reconfigurable systems, and new ideas like quantum computing and approximate computing.

*[[Design Automation Conference]]

* '''Track A:<ref name="tpc-a">[https://www.date-conference.com/tpc Track A – DATE Technical Program Committee]</ref> [[Design computing|Application Design]]''' focuses on real-world examples. It includes designs for smart energy systems, secure and autonomous systems, artificial intelligence, and new technologies used in practical ways.

*[[International Conference on Computer-Aided Design]]

* '''Track T:<ref name="tpc-t">[https://www.date-conference.com/tpc Track T – DATE Technical Program Committee]</ref> [[Dependability|Test and Dependability]]''' is about testing and reliability. It includes fault detection, circuit testing, secure system validation, and ways to make sure systems work even when there are errors.

*[[Asia and South Pacific Design Automation Conference]]

* '''Track E:<ref name="tpc-e">[https://www.date-conference.com/tpc Track E – DATE Technical Program Committee]</ref> [[Embedded system|Embedded Systems Design]]''' includes software and hardware for embedded and cyber-physical systems. Topics cover real-time systems, secure systems, software tools, and using machine learning in embedded devices.

*# Amrouch, H. et al. (2016). "Reliability-aware design to suppress aging" In Proceedings of the 53rd Annual DesignAutomation Conference, P.12

Each track has several specific topics. Authors can choose the one that fits their work. All papers are peer-reviewed and must present original and useful research.

*# Manquinho, V. & Marques-Silva J. (2000) "On Using Satisfiability-Based Pruning Techniques in Covering Algorithms" in Proceedings of the Design, Automation and Test in Europe Conference.

== ExternalYoung linksPeople Programme ==

*[http://www.date-conference.com Main web page] for the DATE conference

The DATE conference hosts the Young People Programme, an initiative aimed at supporting early-career researchers and strengthening academic-industry connections. First introduced in 2019, the program offers career development resources for master's students, PhD candidates, and postdoctoral researchers. It also provides introduces companies and universities to potential employees. The programme includes networking events, mentorship opportunities, and recruiting activities to help participants explore career paths and build professional relationships.<ref name="ypp">[https://www.date-conference.com/young-people-programme DATE Conference – Young People Programme]</ref>

== Conference archive ==

The following table lists past editions of the DATE (Design, Automation and Test in Europe) conference, including the host cities and years. A full archive of events and proceedings is available on the official DATE website.<ref name="archive">[https://www.date-conference.com/archive DATE Conference Archive]</ref> Additional bibliographic information is available through the DBLP computer science bibliography.<ref name="dblp">[https://dblp.org/db/conf/date/index.html DBLP – DATE Conference Proceedings Archive]</ref> Proceedings for each year are accessible via IEEE Xplore.<ref name="ieee">[https://ieeexplore.ieee.org/Xplore/home.jsp IEEE Xplore Digital Library]</ref>

{| class="wikitable sortable collapsible"

! Year !! Location !! Proceedings

|-

| 2025 || Lyon, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/10992638/proceeding IEEE Xplore]</ref>

|-

| 2024 || Valencia, Spain || <ref>[https://ieeexplore.ieee.org/xpl/conhome/10546498/proceeding IEEE Xplore]</ref>

|-

| 2023 || Antwerp, Belgium || <ref>[https://ieeexplore.ieee.org/xpl/conhome/10136870/proceeding IEEE Xplore]</ref>

|-

| 2022 || Antwerp, Belgium || <ref>[https://ieeexplore.ieee.org/xpl/conhome/9774496/proceeding IEEE Xplore]</ref>

|-

| 2021 || Grenoble, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/9473901/proceeding IEEE Xplore]</ref>

|-

| 2020 || Grenoble, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/9112295/proceeding IEEE Xplore]</ref>

|-

| 2019 || Florence, Italy || <ref>[https://ieeexplore.ieee.org/xpl/conhome/8704855/proceeding IEEE Xplore]</ref>

|-

| 2018 || Dresden, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/8337149/proceeding IEEE Xplore]</ref>

|-

| 2017 || Lausanne, Switzerland || <ref>[https://ieeexplore.ieee.org/xpl/conhome/7919927/proceeding IEEE Xplore]</ref>

|-

| 2016 || Dresden, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/7454909/proceeding IEEE Xplore]</ref>

|-

| 2015 || Grenoble, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/7076741/proceeding IEEE Xplore]</ref>

|-

| 2014 || Dresden, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/6784162/proceeding IEEE Xplore]</ref>

|-

| 2013 || Grenoble, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/6507370/proceeding IEEE Xplore]</ref>

|-

| 2012 || Dresden, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/6171057/proceeding IEEE Xplore]</ref>

|-

| 2011 || Grenoble, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/5754459/proceeding IEEE Xplore]</ref>

|-

| 2010 || Dresden, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/5450668/proceeding IEEE Xplore]</ref>

|-

| 2009 || Nice, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/4926138/proceeding IEEE Xplore]</ref>

|-

| 2008 || Munich, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/4475437/proceeding IEEE Xplore]</ref>

|-

| 2007 || Nice, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/4211748/proceeding IEEE Xplore]</ref>

|-

| 2006 || Munich, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/11014/proceeding IEEE Xplore]</ref>

|-

| 2005 || Munich, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/9609/proceeding IEEE Xplore]</ref>

|-

| 2004 || Paris, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/8959/proceeding IEEE Xplore]</ref>

|-

| 2003 || Munich, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/8443/proceeding IEEE Xplore]</ref>

|-

| 2002 || Paris, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/7834/proceeding IEEE Xplore]</ref>

|-

| 2001 || Munich, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/7307/proceeding IEEE Xplore]</ref>

|-

| 2000 || Paris, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/6761/proceeding IEEE Xplore]</ref>

|-

| 1999 || Munich, Germany || <ref>[https://ieeexplore.ieee.org/xpl/conhome/6133/proceeding IEEE Xplore]</ref>

|-

| 1998 || Paris, France || <ref>[https://ieeexplore.ieee.org/xpl/conhome/5270/proceeding IEEE Xplore]</ref>

|}

== Late Breaking Results ==

The DATE conference offers a special track for Late Breaking Results (LBR). This track allows researchers to share new ideas, early-stage findings, or innovative directions that are still in progress. LBR submissions are limited to two pages and must follow the official template. All submissions are reviewed through a blind peer-review process. Selected papers are presented in interactive sessions, where authors can receive feedback and discuss their work with the community.<ref name="cfp" />

== See also ==

* [[Electronic design automation]]

* [[:Category:Electronic design automation software]] (EDA software category)

* [[Design Automation Conference]]

* [[International Conference on Computer-Aided Design]]

* [[Asia and South Pacific Design Automation Conference]]

* [[Symposia on VLSI Technology and Circuits]]

==References==

{{Reflist}}

* https://dblp.org/db/conf/date/index.html

== External links ==

* https://download-pdfs.com/v6/preview/?pid=6&offer_id=26&ref_id=34335f6e1fc40068eb49263e5945981f_e6cef1e4_c28f910b&sub1=36572&keyword=Design,%20Automation,%20And%20Test%20In%20Europe#<nowiki/>

*[https://www.date-conference.com Web page] for the DATE conference

*[https://dblp.org/db/conf/date/index.html dblp: Design, Automation, and Test in Europe]

{{IEEE conferences}}

{{Association for Computing Machinery}}

{{Authority control}}

[[Category:IEEE conferences]]

[[Category:Association for Computing Machinery conferences]]

[[Category:Electronic design automation conferences]]

[[Category:Information technology organizations based in Europe]]

[[Category:International conferences in Germany]]

[[Category:International conferences in France]]