Universal Test Specification Language: Difference between revisions

Revision as of 12:24, 4 December 2019

Latest revision as of 10:09, 22 June 2025

(6 intermediate revisions by 3 users not shown)

Line 1:

{{Short description|Programming language}}

{{Orphan|date=October 2015}}

[[File:UTSL logo.jpg|thumb]]

Line 5 ⟶ 6:

== History ==

Increased complexity of [[ASIC]]s leads to requirements of more complex test programs with longer development times. An automated test program generation could simplify and speed up this process. [[Teradyne]] Inc. together with [[Robert Bosch GmbH]] agreed to develop a concept and a tool chain for an automated test-program generation.<ref name="ATE_Generation">A. Drappa, J. Vollmar und P. Huber, “Automatic Test Program Generation for Automotive Devices”, International Test Conference (ITC), Austin, Texas USA, 2010, Paper 17.1.</ref><ref>{{cite web|url=https://ieeexplore.ieee.org/document/5699253journal|title=Automated test program generation for automotive devices - IEEE Conference Publication|websitedoi=Ieeexplore10.ieee1109/TEST.org2010.5699253|accessdates2cid=8 June 201821650481}}</ref><ref>A. Drappa, P. Huber und J. Vollmar, “Automatic Test Program Generation for Automotive Devices”, 23. GI/GMM/ITG-Workshop Universität Passau, 2011, page 81.</ref> To achieve this a tester independent programming language was required. Hence, UTSL, a programming language that enables detailed description of tests that can be translated into the ATE specific programming language was developed. The ATE manufacturers need to provide a Test Program Generator that uses the UTSL test description as inputs and generates the ATE-specific test code with optimal resource mapping and better practice program code.<ref name="UTSL">R. Baumann, N. Nebel, “Die automatische Generierung von Testprogrammen im täglichen Einsatz”, 27. GI/GMM/ITG-Workshop, Bad Urach 2015, page 59.</ref><ref name="UTSL1">R. Baumann und N. Nebel, “Automated Test Program Generation for Automotive Devices”, Teradyne User Group (TUG) Conference, Fort Worth, TX, 2013.</ref><ref name="UTSL2">R. Baumann und N. Nebel, “Integrating Automated Test Program Generation in Your Daily Workflow Saves Time”, Teradyne User Group (TUG) Conference, Anaheim, California, 2014.</ref>

As long as the ATE manufacturer provides with the test program generator that can use UTSL as an input the cumbersome task of translating a test program from one platform to another can be significantly simplified. In other words, the task of rewriting of the test programs for a specific platform can be replaced by the automatically generating the code from the UTSL based test specification. Prerequisite for this is that the UTSL description of tests is sufficiently detailed with definition of the test technique as well as the description of all the necessary inputs and outputs.<ref name="UTSL" /><ref name="UTSL1" /><ref name="UTSL2" />

Line 13 ⟶ 14:

[[File:Utsl build in 01.jpg|left]]

{{clear}}

UTSL contains high amount of commands and test-functions. It also allows the usage of commonly known high level programming language syntax elements such as <span style="color:#0000FF">"'''if/then/else'''" </span> and, etc.<ref name="UTSL" />

[[File:Utsl syntax.jpg|left]]

{{Clear}}

Line 37 ⟶ 38:

'''SerialPort and SerialDataFrame classes''' - <span style="color:#0000FF">"for device serial communications" </span>

'''Evaluate class''' - <span style="color:#0000FF">"data-logs the results and compares the results to the defined limits" </span>

UTSL also supports the units and scales wherever floating point numbers are used. This is essential for a language that describes a test program where the values can be returned as <span style="color:#0000FF">"'''V''', '''mV''', '''uV''', '''A''', '''mA''', '''uA'''" </span> and, etc.<ref name="ATE_Generation" />

[[File:Force curr meas V.jpg|frame|none|picture1]]