Content deleted Content added
→Standards Organizations: Removed Semiconductor Test Consortium (stc) and addded SEMI Cast |
No edit summary |
||
(34 intermediate revisions by 22 users not shown) | |||
Line 1:
'''Standard Test Data Format''' ('''STDF''') is a proprietary [[file format]] for [[semiconductor]] test information originally developed by [[Teradyne]], but it is now a [[de facto standard]] widely used throughout the semiconductor industry. It is a commonly used format produced by [[automatic test equipment]] (ATE) platforms from companies such as [[
STDF is a [[binary file|binary]] format, but can be converted either to an [[ASCII]] format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data format to extract ASCII text is non-trivial as it involves a detailed comprehension of the STDF specification, the current (2007) version 4 specification being over 100 pages in length. Software tools exist for processing STDF generated files and performing [[statistical analysis]] on a population of [[device under test|tested devices]].
[http://www.kanwoda.com/wp-content/uploads/2015/05/std-spec.pdf Reference: STDF Specifications V4]
[[Category:Computer file formats]]
[[Category:Hardware testing file formats]]
{{tech-stub}}
|