Automatic test pattern generation: Difference between revisions

Revision as of 12:37, 9 December 2021

Revision as of 02:51, 27 October 2022

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* The '''D Algorithm''' was the first practical test generation [[algorithm]] in terms of memory requirements. The D Algorithm [proposed by Roth 1966] introduced '''D Notation''' which continues to be used in most ATPG algorithms. D Algorithm tries to propagate the stuck at fault value denoted by D (for SA0) or {{overline|D}} (for SA1) to a primary output.

* '''Path-Oriented Decision Making''' (PODEM) is an improvement over the D Algorithm. PODEM was created in 1981, by [[Prabhu Goel]], when shortcomings in D Algorithm became evident when design innovations resulted in circuits that D Algorithm could not realize.

* '''Fan-Out Oriented''' ([[FAN Algorithmalgorithm]]) is an improvement over PODEM. It limits the ATPG search space to reduce computation time and accelerates backtracing.

*Methods based on [[Boolean satisfiability]] are sometimes used to generate test vectors.

*'''Pseudorandom test generation''' is the simplest method of creating tests. It uses a [[pseudorandom]] number generator to generate test vectors, and relies on [[logic simulation]] to compute good machine results, and fault simulation to calculate the fault coverage of the generated vectors.