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Statistical process control was pioneered by [[Walter A. Shewhart]] at [[Bell Laboratories]] in the early 1920s. Shewhart developed the control chart in 1924 and the concept of a state of statistical control. Statistical control is equivalent to the concept of [[exchangeability]]<ref>Barlow & Irony (1992)</ref><ref>Bergman (2009)</ref> developed by logician [[William Ernest Johnson]] also in 1924 in his book ''Logic, Part III: The Logical Foundations of Science''.<ref>Zabell (1992)</ref> Along with a team at AT&T that included [[Harold F. Dodge|Harold Dodge]] and Harry Romig he worked to put [[Sampling (statistics)|sampling]] inspection on a rational statistical basis as well. Shewhart consulted with Colonel Leslie E. Simon in the application of control charts to munitions manufacture at the Army's [[Picatinny Arsenal]] in 1934. That successful application helped convince Army Ordnance to engage AT&T's George Edwards to consult on the use of statistical quality control among its divisions and contractors at the outbreak of World War II.
[[W. Edwards Deming]] invited Shewhart to speak at the Graduate School of the U.S. Department of Agriculture and served as the editor of Shewhart's book ''Statistical Method from the Viewpoint of Quality Control'' (1939), which was the result of that lecture. Deming was an important architect of the quality control short courses that trained American industry in the new techniques during WWII. The graduates of these wartime courses formed a new professional society in 1945, the [[American Society for Quality Control]], which elected Edwards as its first president. Deming travelled to Japan during the Allied Occupation and met with the Union of Japanese Scientists and Engineers (JUSE) in an effort to introduce SPC methods to Japanese industry
==='Common' and 'special' sources of variation===
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