Content deleted Content added
Rescuing 2 sources and tagging 0 as dead.) #IABot (v2.0.9.5 |
Adding short description: "IC design techniques that include testability features" |
||
Line 1:
{{Short description|IC design techniques that include testability features}}
'''Design for testing''' or '''design for testability''' ('''DFT''') consists of [[Integrated circuit design| IC design]] techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning.
| |||