Reflection high-energy electron diffraction: Difference between revisions

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*A Review of the Geometrical Fundamentals of RHEED with Application to Silicon Surfaces, John E. Mahan, Kent M. Geib, G.Y. Robinson, and Robert G. Long, ''J.V.S.T.'', A 8, 1990, pp. 3692–3700
 
{{Crystallography}}
{{Authority control}}