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==Phase contrast in HRTEM==
The contrast in HRTEM comes from interference in the image plane between the phases of scattered [[electron]] waves with the phase of the transmitted electron wave. Complex interactions occur when an electron wave passes through a sample in the TEM. Above the sample, the electron wave can be approximated as a plane wave. As the electron wave, or [[wavefunction]], passes through the sample, both the [[phase (waves)|phase]] and the [[amplitude]] of the electron beam is altered. The resultant scattered and transmitted electron beam is then focused by an objective lens, and imaged by a detector in the image plane.
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