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[[File:Example Control Chart - DSE Si Etch.jpg|alt=plot showing silicon etch rate versus date, over months, with ±5% and mean values shown.|thumb|297x297px|Simple example of a process control chart, tracking the etch (removal) rate of Silicon in an [[Inductively coupled plasma|ICP]] [[Plasma etching|Plasma Etcher]] at a [[microelectronics]] [[Wafer fabrication|waferfab]]<ref>{{Cite web |title=Process Group - Process Control Data - UCSB Nanofab Wiki |url=https://wiki.nanofab.ucsb.edu/wiki/Process_Group_-_Process_Control_Data |access-date=2024-11-08 |website=wiki.nanofab.ucsb.edu}}</ref>. Time-series data shows the mean value and ±5% bars. A more sophisticated SPC chart may include "control limit" & "spec limit" % lines to indicate whether/what action should be taken.]]
'''Statistical process control''' ('''SPC''') or '''statistical quality control''' ('''SQC''') is the application of [[statistics|statistical methods]] to monitor and control the quality of a production process. This helps to ensure that the process operates efficiently, producing more specification-conforming products with less waste scrap. SPC can be applied to any process where the "conforming product" (product meeting specifications) output can be measured. Key tools used in SPC include [[run chart]]s, [[control chart]]s, a focus on [[Continuous Improvement Process|continuous improvement]], and [[Design of experiments|the design of experiments]]. An example of a process where SPC is applied is manufacturing lines.
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