Automatic test pattern generation: Difference between revisions

Content deleted Content added
TeamX (talk | contribs)
See Also: Advertisement for fee-based documents
It is true that the IEEE and ACM charge for articles, but they are the (and the conferences) are the primary references.
Line 40:
* [[ASIC]]
* [[VHSIC]]
{{EDASeeAlso}}
 
From http://pico1.e.ft.fontys.nl/publicad.html the simple serial fault simulator '''Faultsim''', intended for educational purposes, that is part of the '''Publicad''' design kit, can be downloaded free of charge.