Standard Test Data Format: Difference between revisions

Revision as of 13:50, 16 February 2012

Revision as of 19:34, 17 February 2012

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'''Standard Test Data Format''' ('''STDF''') is a proprietary [[file format]] for [[semiconductor]] test information originally developed by [[Teradyne]], but nowit widelyis usednow a [[de facto standard|de facto]] widely used throughout the semiconductor industry. It is a commonly used format produced by [[Automaticautomatic Testtest Equipmentequipment]] (ATE) platforms from leading companies such as [[LTX-Credence]], [[Roos Instruments]], [[Teradyne]], [[Verigy]], and others.

STDF is a [[binary file|binary]] format, but can be converted either to an [[ASCII]] format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data format to extract ASCII text is non-trivial as it involves a detailed comprehension of the STDF specification, the current (2007) version 4 specification being over 100 pages in length. Software tools exist for processing STDF generated files and performing [[statistical analysis]] on a population of [[device under test|tested devices]].