Content deleted Content added
m clean up, References after punctuation per WP:REFPUNC and WP:CITEFOOT using AWB (8797) |
m →Hardware testers: link |
||
Line 8:
=== Hardware testers ===
High-end [[automatic test equipment]] (ATE) Class Memory testers are used by most OEM memory chip manufacturers such as Samsung, Hyundai, Micron…etc. They are typically priced starting at one million dollars per system. This equipment must be operated by well trained semiconductor engineers. ATE Class Memory testers are built with very complex test algorithms to detect memory faults during the final stages of memory chip packaging.
Mid-range memory testers typically priced under $26,000,<ref>http://www.pcstats.com/articleview.cfm?articleID=1174</ref> and are commonly found in memory module manufacturing assembly houses. These testers are built to support mass volumes of memory module testing. They are also used for detecting assembly faults caused by mis-soldering and cross-cell contamination after chips are assembled onto [[Printed circuit board|PCB]] or SIMM cards. These memory testers are usually docked onto an automatic handling system for high volume production testing, thus eliminating manual intervention by an operator.
| |||