Reflection high-energy electron diffraction: Difference between revisions

Revision as of 18:13, 9 May 2013

Revision as of 20:52, 18 June 2013

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==Surface diffraction==

In the RHEED setup, only atoms at the sample surface contribute to the RHEED pattern.<ref name="braun1999">{{cite book|author=Braun W|title=Applied RHEED: Reflection High-Energy Electron Diffraction During Crystal Growth|publisher=Springer-Verlag: Berlin|year=1999|pages=14–17, 25, 75|isbn=3-540-65199-3}}</ref> The glancing angle of incident electrons preventsAllow them fromto escapingescape the bulk of the sample and reachingto reach the detector. Atoms at the sample surface diffract (scatter) the incident electrons due to the wavelike properties of electrons.

The diffracted electrons interfere constructively at specific angles according to the crystal structure and spacing of the atoms at the sample surface and the wavelength of the incident electrons. Some of the electron waves created by constructive interference collide with the detector, creating specific diffraction patterns according to the surface features of the sample. Users characterize the crystallography of the sample surface through analysis of the diffraction patterns. Figure 2 shows a RHEED pattern.