Failure of electronic components: Difference between revisions

Revision as of 03:18, 16 August 2013

Revision as of 12:47, 16 September 2013

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The heat and current of the electrical arc across the contacts creates specific cone & crater formations from metal migration. In addition to the physical contact damage, there appears also a coating of carbon and other matter. This degradation drastically limits the overall operating life of a relay or contactor to a range of perhaps 100,000 operations, a level representing 1% or less than the mechanical life expectancy of the same device.<ref>{{cite web | title = Lab Note #105 ''Contact Life - Unsuppressed vs. Suppressed Arcing'' | author= | publisher = Arc Suppression Technologies | date = August 2011 | url = http://www.arcsuppressiontechnologies.com/Documentsarc-suppression-facts/Lab%20Note%20107%20lab-%20AUG2011%20app-%20Relay%20Life%201M.pdfnotes/ | accessdate = March 10, 2012}}</ref>

==Semiconductor failures==