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Line 31: * Early test generation algorithms such as [[boolean difference]] and [[literal proposition]] were not practical to implement on a computer. * The '''D Algorithm''' was the first practical test generation [[algorithm]] in terms of memory requirements. The D Algorithm [proposed by ~~J.P~~ Roth 1966] introduced '''D Notation''' which continues to be used in most ATPG algorithms. D Algorithm tries to propagate the stuck at fault value denoted by D (for SA0) or {{overline\|D}} (for SA1) to a primary output. * '''Path-Oriented Decision Making''' (PODEM) is an improvement over the D Algorithm. PODEM was created in 1981, by [[Prabhu Goel]], when shortcomings in D Algorithm became evident when design innovations resulted in circuits that D Algorithm could not realize. * '''Fan-Out Oriented''' ([[FAN Algorithm]]) is an improvement over PODEM. It limits the ATPG search space to reduce computation time and accelerates backtracing.

Automatic test pattern generation: Difference between revisions