Automatic test pattern generation: Difference between revisions

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adding other types of fault modes
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This model is used to describe faults for CMOS logic gates. At transistor level, a transistor maybe stuck-short or stuck-open. In stuck-short, a transistor behaves as it is always conducts (or stuck-on), and stuck-open is when a transistor never conducts current (or stuck-off). Stuck-short will produce a short between VDD and VSS.
 
==== bridgingBridging faults ====
A short circuit between two signal lines is called bridging faults. bridging to VDD or Vss is equivalent to stuck at fault model. Traditionally both signals after bridging were modeled with logic AND or OR of both signals. If one driver dominates the other driver in a bridging situation, the dominant driver forces the logic to the other one, in such case a dominant bridging fault is used. To better reflect the reality of CMOS VLSI devices, a Dominant AND or Dominant OR bridging fault model is used. in the latter case, dominant driver keeps its value, while the other one gets the AND or OR value of its own and the dominant driver.
 
==== opensOpens faults ====
 
==== Delay faults ====