Universal Test Specification Language: Difference between revisions

Revision as of 10:42, 8 May 2015

Revision as of 10:46, 8 May 2015

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'''UTSL'''

(Universal Test Specification Language) <ref name="UTSL">R. Baumann, N. Nebel, “Die automatische Generierung von Testprogrammen im täglichen Einsatz”, 27. GI/GMM/ITG-Workshop, Bad Urach 2015, page 59.</ref> is a programming language used to describe [[ASIC]] tests in a format that leads to an automated translation of the test specification into and executable test code. UTSL<ref name="UTSL" /> is platform independent and provided a code generation interface for a specific platform is available, UTSL<ref name="UTSL" /> code can be translated into the programming language of a specific ATE<ref name="ATE">https://en.wikipedia.org/wiki/Automatic_test_equipment</ref> ([[Automatic testTest equipment]]Equipment).

<ref name="ATE_generation">A. Drappa, P. Huber und J. Vollmar, “Automatic Test Program Generation for Automotive Devices”, 23. GI/GMM/ITG-Workshop Universität Passau, 2011, Seite 81.</ref>

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== History ==

Increased complexity of [[ASIC]]s lead to requirements of more complex test programs with longer development times. An automated test program generation could simplify and speed up this process. <ref> A. Drappa, J. Vollmar und P. Huber, “Automatic Test Program Generation for Automotive Devices”, International Test Conference (ITC)<ref>https://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=32654</ref>, Austin, Texas USA, 2010, Paper 17.1. </ref> <ref> http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5699253&tag=1 </ref> Teradyne Inc. together with Robert Bosch GmbH agreed to developed a concept and a tool chain for an automated test-program generation. To achieve this a tester independent programming language was required. Hence, UTSL<ref name="UTSL" />, a programming language that enables detailed description of tests that can be translated into the ATE<ref name="ATE" /> specific programming language was developed. The ATE manufacturers need to provide a Test Program Generator that uses the UTSL<ref name="UTSL" /> test description as inputs and generates the ATE<ref name="ATE" />-specific test code with optimal resource mapping and best practice program code.

As long as the ATE manufacturer provides with the test program generator that can use UTSL<ref name="UTSL" /> as an input the cumbersome task of translating a test program from one platform to another can be significantly simplified. In other words the task of rewriting of the test programs for a specific platform can be replaced by the automatically generating the code from the UTSL<ref name="UTSL" /> based test specification. Prerequisite for this is that the UTSL<ref name="UTSL" /> description of tests is sufficiently detailed with definition of the test technique as well as the description of all the necessary inputs and outputs.

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Also more complex tests such as serial communications with [[ASIC]] that require write and/or read to and from register can be easily implemented using UTSL<ref name="UTSL" />.

The example below shows a test where a certain trim code is written to a register and based on the trim code the internal regulator steps in voltage which is read back (''see the picture2'').

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== Advantages ==

* UTSL<ref name="UTSL" /> needs to be learnt once unlike the ATE<ref name="ATE" /> specific languages that can vary from one ATE<ref name="ATE" /> manufacturer to another

* It it easier to reuse test methods written in UTSL because the test code is not dependent on the specific ATE instruments

* UTSL<ref name="UTSL" /> as a standardized language is easier for people other than the code author to be read and debugged