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== History ==
Increased complexity of [[ASIC]]s lead to requirements of more complex test programs with longer development times. An automated test program generation could simplify and speed up this process. <ref> A. Drappa, J. Vollmar und P. Huber, “Automatic Test Program Generation for Automotive Devices”, International Test Conference (ITC), Austin, Texas USA, 2010, Paper 17.1. </ref> <ref> https://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=32654
<ref> http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5699253&tag=1 </ref> Teradyne Inc. together with Robert Bosch GmbH agreed to developed a concept and a tool chain for an automated test-program generation. To achieve this a tester independent programming language was required. Hence, UTSL<ref name="UTSL" />, a programming language that enables detailed description of tests that can be translated into the ATE<ref name="ATE" /> specific programming language was developed. The ATE manufacturers need to provide a Test Program Generator that uses the UTSL<ref name="UTSL" /> test description as inputs and generates the ATE<ref name="ATE" />-specific test code with optimal resource mapping and best practice program code. As long as the ATE manufacturer provides with the test program generator that can use UTSL<ref name="UTSL" /> as an input the cumbersome task of translating a test program from one platform to another can be significantly simplified. In other words the task of rewriting of the test programs for a specific platform can be replaced by the automatically generating the code from the UTSL<ref name="UTSL" /> based test specification. Prerequisite for this is that the UTSL<ref name="UTSL" /> description of tests is sufficiently detailed with definition of the test technique as well as the description of all the necessary inputs and outputs.
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