Universal Test Specification Language: Difference between revisions

Revision as of 11:09, 8 May 2015

Revision as of 11:14, 8 May 2015

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== Design ==

UTSL is a C# <ref> https://en.wikipedia.org/wiki/C_shell</ref> like language where the test are defined as blocks of code. Simple tests such a forcing current and measuring voltage or visa versa can be easily written in UTSL and with the means of the ATE ([[Automatic Test Equipment]]) specific code generator translated into testable code (''see the picture1'').

UTSL allows the user to set the instruments ranges and clamps in order to guarantee the measurement precision and to prevent the measurements from exceeding the instrument clamp values. The current UTSL capabilities can cover c.a. 70% of the required test specification for [[ASIC]] testing. For the remaining 30% one could use the option of writing comments in an informal form as it was done in the past. The vision is that in the future UTSL will be capable of covering close to 100% of the testing requirements.