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Becuase the envelope terms damp more strongly at higher spatial frequencies, there comes a point where no more phase signal can pass through. This is called the '''Information Limit''' of the microscope, and is one measure of the resolution.
Modeling the envelope function can give insight into both TEM instrument design, and imaging parameters. By modeling the different aberrations via envelope terms, it is possible to see which aberrations are most limiting the phase signal.
Various [http://jiang.bio.purdue.edu/software/ctf/ctfapplet.html software] [http://www.maxsidorov.com/ctfexplorer/ packages] have been developed to model both the Contrast Transfer Function and Envelope Function for particular microscopes, and particular imaging parameters.
== Linear Imaging Theory vs. Non-Linear Imaging Theory ==
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