Memory tester: Difference between revisions

Revision as of 03:16, 23 January 2016

Revision as of 07:34, 31 January 2017

Line 10:

Mid-range memory testers typically priced under $26,000,<ref>http://www.pcstats.com/articleview.cfm?articleID=1174</ref> and are commonly found in memory module manufacturing assembly houses. These testers are built to support mass volumes of memory module testing. They are also used for detecting assembly faults caused by mis-soldering and cross-cell contamination after chips are assembled onto [[Printed circuit board|PCB]] or SIMM cards. These memory testers are usually docked onto an automatic handling system for high volume production testing, thus eliminating manual intervention by an operator.

Low-end memory testers (e.g.,[RAM Stress Test]<ref>https://www.uxd.com/ram-stress-test.html</ref>) are usually relatively low cost ranging from $700 – $1,300<ref>http://shop.uxd.com/category-s/110.htm</ref>. RAM Stress Test identifies memory defects that may have passed every usual manufacturing ATE test, but which can still fail in normal use. A major advantage of RAM Stress Test compared to ATE, is the capability of testing and validating RAM within the complete system environment (CPU, Memory, Motherboard, Power Supply), testing for Behavioral failures that are sensitive to system idiosyncrasy. .

Low-end memory testers are usually relatively low cost ranging from $1000 – $3000. Their main features are portability, ease of use and relatively small size. They are typically used by the service industry especially by computer service technicians, RMA departments, memory reseller/brokers/ and wholesalers for verifying and testing memory modules that fails in PC system or before going into PC. Quality and features of this range of memory testers varies greatly depending on the manufacturer. A good memory tester is built with features comparable with high-end ATE and medium range memory tester. The key is to provide a simple to use tester at an affordable price that is still effective in capturing most memory faults and failures.

=== Software testers ===