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==Optical properties==
There are several approaches to analyze transmittance data of selenium films, from which one can extract their optical constants and other related topics.<ref>{{Cite journal|last=Jafar|first=Mousa M. Abdul-Gader|last2=Saleh|first2=Mahmoud H.|last3=Ahmad|first3=Mais Jamil A.|last4=Bulos|first4=Basim N.|last5=Al-Daraghmeh|first5=Tariq M.|date=2016-04-01|title=Retrieval of optical constants of undoped amorphous selenium films from an analysis of their normal-incidence transmittance spectra using numeric PUMA method|url=https://link.springer.com/article/10.1007/s10854-015-4156-z|journal=Journal of Materials Science: Materials in Electronics|language=en|volume=27|issue=4|pages=3281–3291|doi=10.1007/s10854-015-4156-z|issn=0957-4522}}</ref> However, the algebraic method of Swanepoel envelope method (EM) seems to be trustful and need no dispersion relations in prior, but is limited to transmittance spectra that display a number of peaks (maxima and minima).<ref>{{Cite journal|last=Saleh|first=Mahmoud H.|last2=Ershaidat|first2=Nidal M.|last3=Ahmad|first3=Mais Jamil A.|last4=Bulos|first4=Basim N.|last5=Jafar|first5=Mousa M. Abdul-Gader|date=2017-06-01|title=Evaluation of spectral dispersion of optical constants of a-Se films from their normal-incidence transmittance spectra using Swanepoel algebraic envelope approach|url=https://link.springer.com/article/10.1007/s10043-017-0311-5|journal=Optical Review|language=en|volume=24|issue=3|pages=260–277|doi=10.1007/s10043-017-0311-5|issn=1340-6000}}</ref> However, EM method has a further limitation that is only of good validity in a wide spectral region in the quasi-transparency <ref>{{Cite web|url=https://www.researchgate.net/publication/272292433_Comprehensive_formulations_forthe_total_normal-incidence_optical_reflectance_and_transmittance_of_thin_films_laid_on_thick_substrates|title=Comprehensive formulations forthe total normal-incidence optical reflectance and transmittance of thin films laid on thick substrates|website=ResearchGate|language=en|access-date=2017-11-06}}</ref><ref>{{Cite
== Thermoanalytical properties ==
[[Stoichiometry|Stoichiometric]] films of selenium-based alloys such as those of Bi-Se and Bi-Te composites are of technical importance for applications in [[memory switch devices]]. Thermoanalytical studies often give information about their stoichiometry, melting/boiling points and kinetic reactions responsible for their decomposition and crystallization. A preliminary thermoanalytical study on Bi-Se composites were conducted via [[Thermogravimetric analysis|thermogravimetry]] (TG) and differential thermogravimetry (DTG) experiments using a single heating rate and analyzing the measured non-isothermal TG and DTG curves via model-based [[Fictitious force|kinetic reaction]] formulas of original Coats-Redfern (CR) and Achar-Brindley-Sharp (ABS) equations, though it is always preferable to analyze such TG and DTG data on the basis of model-free kinetic reaction formulations and several heating rates.<ref>{{Cite journal|last=Ahmad|first=Mais Jamil A.|last2=Jafar|first2=Mousa M. Abdul-Gader|last3=Saleh|first3=Mahmoud H.|last4=Shehadeh|first4=Khawla M.|last5=Telfah|first5=Ahmad|last6=Ziq|first6=Khalil A.|date=2017-09-30|title=Evaluation of Kinetic Parameters and Thermal Stability of Melt-Quenched Bi<sub>x</sub>Se<sub>100−x</sub> Alloys (x ≤7.5 at%) by Non-Isothermal Thermogravimetric Analysis|url=http://www.appmicro.org/journal/view.html?uid=223&&vmd=Full|journal=Applied Microscopy|language=en|volume=47|issue=3|doi=10.9729/AM.2017.47.3.110|issn=2287-5123}}</ref>
== Electric and dielectric properties ==
==See also==
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