Automatic test pattern generation: Difference between revisions

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Equivalent faults produce the same faulty behavior for all input patterns. Any single fault from the set of equivalent faults can represent the whole set. In this case, much less than ''k×n'' fault tests are required for a circuit with ''n'' signal line. Removing equivalent faults from entire set of faults is called fault collapsing.
 
==== The Stuckstuck-at fault model ====
{{main|Stuck-at fault}}
In the past several decades, the most popular fault model used in practice is the single [[stuck-at fault]] model. In this model, one of the signal lines in a circuit is assumed to be stuck at a fixed logic value, regardless of what inputs are supplied to the circuit. Hence, if a circuit has ''n'' signal lines, there are potentially ''2n'' stuck-at faults defined on the circuit, of which some can be viewed as being equivalent to others. The stuck-at fault model is a ''logical'' fault model because no delay information is associated with the fault definition. It is also called a ''permanent'' fault model because the faulty effect is assumed to be permanent, in contrast to ''intermittent'' faults which occur (seemingly) at random and ''transient'' faults which occur sporadically, perhaps depending on operating conditions (e.g. temperature, power supply voltage) or on the data values (high or low voltage states) on surrounding signal lines. The single stuck-at fault model is ''structural'' because it is defined based on a structural gate-level circuit model.