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Line 115: ===MCP-RHEED=== MCP-RHEED is a system in which an [[electron beam]] is amplified by a [[micro-channel plate]] (MCP). This system consists of an [[electron gun]] and an MCP equipped with a [[fluorescence\|fluorescent]] screen opposite to the electron gun. Because of the amplification, the intensity of the electron beam can be decreased by several orders of magnitude and the damage to the samples is diminished. This method is used to observe the growth of [[Electrical insulation\|insulator]] crystals such as [[Organic compound\|organic]] films and [[alkali halide]] films, which are easily damaged by electron beams.<ref name="saiki">{{cite journal\|author=Saiki K\|author2=Kono T\|author3=Ueno K\|author4=Koma A\|last-author-amp=yes\|title=Highly sensitive reflection high-energy electron diffraction measurement by use of micro-channel imaging plate\|journal=Rev. Sci. Instrum.\|volume=71\|pages=3478\|date=2000\|doi=10.1063/1.1287625\|bibcode = 2000RScI...71.3478S\|issue=9 ~~\|url=http://sucra.saitama-u.ac.jp/modules/xoonips/download.php?id=A1002598~~}}</ref> ==References==

Reflection high-energy electron diffraction: Difference between revisions