Standard Test Data Format: Difference between revisions

Revision as of 10:02, 27 August 2019

Revision as of 17:42, 30 August 2019

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'''Standard Test Data Format''' ('''STDF''') is a proprietary [[file format]] for [[semiconductor]] test information originally developed by [[Teradyne]], but it is now a [[de facto standard]] widely used throughout the semiconductor industry. It is a commonly used format produced by [[automatic test equipment]] (ATE) platforms from companies such as [[LTX-Credence]], [[Roos Instruments]], [[Teradyne]], [[Advantest]], and others.

STDF is a [[binary file|binary]] format, but can be converted either to an [[ASCII]] format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data format to extract ASCII text is non-trivial as it involves a detailed comprehension of the STDF specification, the current (2007) version 4 specification being over 100 pages in length. Software tools exist for processing STDF generated files and performing [[statistical analysis]] on a population of [[device under test|tested devices]].

==References==

{{Reflist}}

<ref>* {{Cite web|url=https://yieldhub.com/2019/01/11/stdf-standard-test-data-format/|title=yieldHUB|last=|first=|date=|website=yieldHUB.com|archive-url=|archive-date=|dead-url=|access-date=}}</ref>

== External links ==

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[[Category:Hardware testing file formats]]

<ref>{{Cite web|url=https://yieldhub.com/2019/01/11/stdf-standard-test-data-format/|title=yieldHUB|last=|first=|date=|website=yieldHUB.com|archive-url=|archive-date=|dead-url=|access-date=}}</ref>

{{tech-stub}}