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'''ATPG''', or '''Automatic test pattern generation''' is an [[electronic design automation]] tool used to find an input (or test) sequence that, when applied to a [[digital circuit]], enables testers to distinguish between the correct circuit behavior and the faulty circuit behavior caused by a particular fault. The effectiveness of ATPG is measured by the fault coverage achieved for the [[fault model]] and the number of generated vectors, which should be directly proportional to test application time. ATPG efficiency is another important consideration. It is influenced by the fault model under consideration, the type of circuit under test ([[Scan chain|full scan]], synchronous sequential, or asynchronous sequential), the level of abstraction used to represent the circuit under test (gate, register-transistor, switch), and the required [[Fault coverage|test quality]].
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