Single particle analysis: Difference between revisions

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Added definition of ICP-MS (Induced Coupled Plasma-Mass Spectroscopy)
Techniques: Removed broken link to an example
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Single particle analysis can be done on both [[negative stain|negatively stained]] and vitreous ice-embedded [[Cryogenic transmission electron microscopy|CryoTEM]] samples. Single particle analysis methods are, in general, reliant on the sample being homogeneous, although techniques for dealing with [https://pubmed.ncbi.nlm.nih.gov/24089719/ conformational heterogeneity] are being developed.
 
Images (micrographs), in the past, were collected on film are digitized using high-quality scanners or using built-in [[charge-coupled device|CCD]] detectors coupled to a phosphorescent layer. Now it is common to use direct electron detectors to collect images. The image processing is carried out using specialized software [[Software tools for molecular microscopy|programs]] (for instance<ref>{{Cite web | url=http://www.femtoscanonline.com/wiki/en/processing/%D0%B0%D0%BD%D0%B0%D0%BB%D0%B8%D0%B7_%D0%B2%D1%8B%D0%B4%D0%B5%D0%BB%D0%B5%D0%BD%D0%BD%D1%8B%D1%85_%D0%BE%D0%B1%D0%BB%D0%B0%D1%81%D1%82%D0%B5%D0%B9 |title = 送彩金38满100提现_无需申请自动送彩金【官网】}}</ref>), often run on multi-processor [[Computer cluster|computer clusters]]. Depending on the sample or the desired results, various steps of two- or three-dimensional processing can be done.
In addition, single particle analysis can also be performed in an individual particle mode using an ICP-MS unit.