Robustness validation: Difference between revisions

Revision as of 11:55, 30 August 2020

Revision as of 02:21, 23 September 2021

Line 9:

At the beginning of the 1970s a relatively high failure rates of electronic components were tolerable in [[automobile]]s, because they replaced mechanical components, which had a much higher [[failure rate]]. The underlying failure rates of bimetallic [[Automotive lighting|flasher]]s were 10% per year and the lifetime of mechanical [[Circuit breaker|ignition contacts]] at 10,000 miles. With the increasing number of [[semiconductor]]s in [[control unit]]s, and the introduction of the first safety systems ([[anti-lock brakes|ABS]]) in the 70s had to be addressed. Already in 1975, the'' General Specification for IC's in Automotive Applications'' <ref>General Specification for ICs in Automotive Applications, SAE Recommendation, 1975</ref> as the first'' [[Society of Automotive Engineers|SAE]] Recommendation was issued'','' the 1978 SAE standard'' <ref>General Specification for ICs in Automotive Applications, SAE standard, 1978,</ref> was declared and adopted by major semiconductor manufacturers.

The establishment of the Automotive Electronic Council ([[Automotive Electronics Council|AEC]]) 1994 by [[Ford Motor Company|Ford]], [[Chrysler]], [[General Motors|GM]] - [[ACDelco|Delco]] was also the Starting point for the AEC-Q100 qualification process,<ref>Automotive Electronic Council's Stress Test Qualification for Integrated Circuits, AEC Q100, Rev. G, 2007, to [http://www.aecouncil.com/AECDocuments.html aecouncil.com]</ref> was based on the SAE standards.

Due to the development of [[automotive]] and the ever-increasing complexity of vehicles associated with the demands for lower error rates of this qualification process, this process to decide by nonspecific tests, to cover a wide range of possible failure mechanisms, but only on the functionality of the component is out of date. In order to make statements about the robustness AEC Q100 can be replaced robustness validation.