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The CTM is a [[black-box testing]] method and supports any type of system under test. This includes (but is not limited to) [[Computer hardware|hardware systems]], integrated hardware-software systems, plain [[software system]]s, including [[embedded software]], [[user interface]]s, [[operating system]]s, [[parser]]s, and others (or [[subsystem]]s of mentioned systems).
With a selected system under test, the first step of the classification tree method is the identification of test relevant aspects.<ref name=lkk
Any system under test can be described by a set of classifications, holding both input and output parameters.
(Input parameters can also include [[Environment (systems)|environment]]s states, [[pre-condition]]s and other, rather uncommon parameters).<ref name=advStest
Each classification can have any number of disjoint classes, describing the occurrence of the parameter.
The selection of classes typically follows the principle of [[equivalence partitioning]] for abstract test cases and [[boundary-value analysis]] for concrete test cases.<ref name=pierre
Together, all classifications form the classification tree.
For semantic purpose, classifications can be grouped into ''compositions''.
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In the second step, test cases are composed by selecting exactly one class from every classification of the classification tree.
The selection of test cases originally<ref name=GG
=== Example ===
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== Classification Tree Editor ==
The '''Classification Tree Editor''' (CTE) is a software tool for test design that implements the classification tree method.<ref name=vehicleElectronics>{{cite book|last=International|first=SAE|title=Vehicle electronics to digital mobility : the next generation of convergence
Over the time, several editions of the CTE tool have appeared, written in several (by that time popular) [[programming languages]] and developed by several companies.
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|CTE 2.1
|2003
|Embedded system version of [[Razorcat
|C++
|win32
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| CTE XL 1.9 ||2009|| Last Java-only Version|| Java || win32
|-
| CTE XL Professional 2.1 || 2011-02-21 || First [[Eclipse (software)|Eclipse]]-based Version, Prioritized Test Case Generation,<ref name=luniak /> [[Deterministic]] Test Case Generation, [[Requirements traceability|Requirements-Tracing]] with [[IBM Rational DOORS|DOORS]]|| [[
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| CTE XL Professional 2.3 || 2011-08-02 || [[Quality Center|QualityCenter]] integration, Requirements Coverage Analysis and [[Traceability matrix|Traceability Matrix]], [[API]]|| Java 6, Eclipse 3.6 || win32
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| CTE XL Professional 3.3 || 2013-05-28 || Test Coverage Analysis, Variant Management (e.g. as part of [[Product family engineering|Product Family Engineering]]), Equivalence Class Testing|| Java 6, Eclipse 3.7 || win32, win64
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| CTE XL Professional 3.5 || 2013-12-18 || Boundary Value Analysis Wizard, Import of [[AUTOSAR]] and [[MATLAB]] models || [[
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| TESTONA 4.1 || 2014-09-22 || Bug fix release || Java 7, Eclipse 3.8 || win32, win64
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| TESTONA 4.5 || 2016-01-21 || Enhanced Export Facilities, [[GUI]] Improvements || Java 7, Eclipse 3.8 || win32, win64
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| TESTONA 5.1 || 2016-07-19 || Bug fix release, Switch to [[
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|CTE 4.0
|