Electron backscatter diffraction: Difference between revisions

Content deleted Content added
No edit summary
Line 194:
However, 3D EBSD also has some limitations. It requires extensive data acquisition and processing, proper alignment between slices, and can be time-consuming and computationally intensive.<ref>{{Cite journal |last=Pirgazi |first=Hadi |date=2019 |title=On the alignment of 3D EBSD data collected by serial sectioning technique |journal=Materials Characterization |volume=152 |pages=223–229 |doi=10.1016/j.matchar.2019.04.026 |s2cid=149835216 }}</ref> In addition, the quality of the 3D map depends on the quality of the individual EBSD maps, which can be affected by factors such as sample preparation, data acquisition parameters, and analysis methods.<ref name=":36" /><ref>{{Cite journal |last1=Winiarski |first1=B. |last2=Gholinia |first2=A. |last3=Mingard |first3=K. |last4=Gee |first4=M. |last5=Thompson |first5=G. |last6=Withers |first6=P. J. |date=2021 |title=Correction of artefacts associated with large area EBSD |journal=Ultramicroscopy |volume=226 |pages=113315 |doi=10.1016/j.ultramic.2021.113315 |pmid=34049196 |s2cid=235241941 }}</ref> Overall, 3D EBSD is a powerful technique for studying the crystallographic structure of materials in three dimensions, and is widely used in materials science and engineering research and development.<ref>{{Cite journal |last1=Konijnenberg |first1=P. J. |last2=Zaefferer |first2=S. |last3=Raabe |first3=D. |date=2015 |title=Assessment of geometrically necessary dislocation levels derived by 3D EBSD |journal=Acta Materialia |volume=99 |pages=402–414 |doi=10.1016/j.actamat.2015.06.051 |bibcode=2015AcMat..99..402K }}</ref><ref name=":40" />
 
=== Transmission Kikuchi diffraction ===
 
== Notes ==