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| pmid = 21329337
| quote = Programs in LPC programming language were developed to perform the following tasks: First, each set of CVs was separated into single CVs, and each of them were plotted. An average CV from all the CVs in one set was calculated and plotted as well. All images belonging to one set of CVs were combined into short animated movies to visualize the changes over time. The graphs of the averaged CVs from all measurement points within a line scan were combined into an animation for demonstrating the systematic changes along each of the Pt stripes. After that, specific parameters were extracted from each CV (see below). These parameters and some derived values were tabulated and plotted versus the x-coordinate of the measurement point. Thus, different graphs for each line scan were created showing the changes in specific properties along the thickness of the Pt stripe. The combined tabulated data for each wafer was then used to plot a 3D image of several parameters vs substrate composition and nominal thickness. The LPC programs were compiled using LDMud (V3.3.719).
| hdl = 11336/105712
| hdl-access = free
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<ref name="taylor">{{cite book
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