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== Applications ==
[[File:EBSD setup.jpg|thumb|The EBSD detector has forward scattered electron diodes (FSDs) at the bottom, in the middle (MSD) and at the top of the detector. |alt=The EBSD detector has forward scattered electron diodes (FSDs) at the bottom, in the middle (MSD) and at the top.]]▼
EBSD is used in a wide range of applications, including materials science and engineering,<ref name=":20" /> geology,<ref>{{Citation |last1=Prior |first1=David J. |title=EBSD in the Earth Sciences: Applications, Common Practice, and Challenges |date=2009 |work=Electron Backscatter Diffraction in Materials Science |pages=345–360 |place=Boston, MA |publisher=Springer US |isbn=978-0-387-88135-5 |last2=Mariani |first2=Elisabetta |last3=Wheeler |first3=John|doi=10.1007/978-0-387-88136-2_26 }}</ref> and biological research.<ref>{{Cite journal |last1=Choi |first1=Seung |last2=Han |first2=Seokyoung |last3=Lee |first3=Yuong‐Nam |date=2019 |editor-last=Rahman |editor-first=Imran |title=Electron backscatter diffraction (EBSD) analysis of maniraptoran eggshells with important implications for microstructural and taphonomic interpretations |journal=Palaeontology |volume=62 |issue=5 |pages=777–803 |doi=10.1111/pala.12427 |bibcode=2019Palgy..62..777C |s2cid=182770470 }}</ref><ref>{{Cite journal |last1=Wolfe |first1=Kennedy |last2=Smith |first2=Abigail M. |last3=Trimby |first3=Patrick |last4=Byrne |first4=Maria |date=2013-08-01 |title=Microstructure of the paper nautilus (''Argonauta nodosa'') shell and the novel application of electron backscatter diffraction (EBSD) to address effects of ocean acidification |journal=Marine Biology |volume=160 |issue=8 |pages=2271–2278 |doi=10.1007/s00227-012-2032-4 |s2cid=253745873 }}</ref> In [[materials science]] and engineering, EBSD is used to study the microstructure of metals, ceramics, and polymers, and to develop [[Computational materials science|models of material behaviour]].<ref>{{Cite journal |last1=Piazolo |first1=S. |last2=Jessell |first2=M. W. |last3=Prior |first3=D. J. |last4=Bons |first4=P. D. |date=2004 |title=The integration of experimental in-situ EBSD observations and numerical simulations: a novel technique of microstructural process analysis |journal=Journal of Microscopy |volume=213 |issue=3 |pages=273–284 |doi=10.1111/j.0022-2720.2004.01304.x|pmid=15009695 |s2cid=24037204 }}</ref> In geology, EBSD is used to study the crystallographic structure of minerals and rocks. In biological research, EBSD is used to study the microstructure of biological tissues and to investigate the structure of biological materials such as bone and teeth.<ref>{{Cite journal |last1=Koblischka-Veneva |first1=Anjela |last2=Koblischka |first2=Michael R. |last3=Schmauch |first3=Jörg |last4=Hannig |first4=Matthias |date=2018 |title=Human dental enamel: A natural nanotechnology masterpiece investigated by TEM and t-EBSD |journal=Nano Research |volume=11 |issue=7 |pages=3911–3921 |doi=10.1007/s12274-018-1968-1 |s2cid=139757769 }}</ref>
=== Scattered electron imaging ===
{{Multiple images
[[File:VFSD image of DSS.jpg|thumb|Far-field image of [[475 °C embrittlement|475 °C embrittled]] [[duplex stainless steel]] with the virtual forward-scatter detector (VFSD) positioned at 38 mm from the sample|alt=Far-field image of 475 °C embrittled duplex stainless steel with the virtual forward-scatter detector (VFSD) positioned at 38 mm from the sample]]▼
| image1 = EBSD setup.jpg
| image2 = VFSD image of DSS.jpg
| total_width = 400
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EBSD detectors can have forward scattered electron [[diode]]s (FSD) at the bottom, in the middle (MSD) and at the top of the detector. Forward-scattered electron (FSE) imaging involves collecting electrons scattered at small angles from the surface of a sample, which provides information about the surface topography and composition.<ref name=":34" /><ref name=":46">{{Cite journal |last1=Schwarzer |first1=Robert A |last2=Hjelen |first2=Jarle |date=2015-01-09 |title=Backscattered Electron Imaging with an EBSD Detector |url=https://doi.org/10.1017/S1551929514001333 |journal=Microscopy Today |volume=23 |issue=1 |pages=12–17 |doi=10.1017/S1551929514001333|s2cid=138740715 |doi-access=free }}</ref> The FSE signal is also sensitive to the crystallographic orientation of the sample. By analysing the intensity and contrast of the FSE signal, researchers can determine the crystallographic orientation of each pixel in the image.<ref name=":37">{{Cite journal |last1=Tong |first1=Vivian S. |last2=Knowles |first2=Alexander J. |last3=Dye |first3=David |last4=Britton |first4=T. Ben |date=2019-01-01 |title=Rapid electron backscatter diffraction mapping: Painting by numbers |journal=Materials Characterization |volume=147 |pages=271–279 |arxiv=1809.07283 |doi=10.1016/j.matchar.2018.11.014 |s2cid=119328762}}</ref>
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