Stretchable microelectrode array: Difference between revisions

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===Structural Design===
* '''Geometric patterning, [[fractal]] patterns''': Metal traces are deposited in specific patterns, such as meandering or [[Serpentine shape|serpentine]] shapes, within a stretchable elastomeric substrate to accommodate [[Strain (mechanics)|strain]]. The resulting structure is akin to a 2-dimensional spring. The University of Ghent and IMEC in Belgium have pioneered the approach to using Meander shaped metallic structures.<ref>{{cite journal |last1=Gonzalez |first1=Mario |last2=Vandevelde |first2=Bart |last3=Christiaens |first3=Wim |last4=Hsu |first4=Yung-Yu |last5=Iker |first5=François |last6=Bossuyt |first6=Frederick |last7=Vanfleteren |first7=Jan |last8=Sluis |first8=Olaf van der |last9=Timmermans |first9=P.H.M. |title=Design and implementation of flexible and stretchable systems |journal=Microelectronics Reliability |date=June 2011 |volume=51 |issue=6 |pages=1069–1076 |doi=10.1016/j.microrel.2011.03.012 }}</ref>
** The group of John Rogers increased the maximum strain in devices created by this approach using fractal-based structures. These fractal patterns are characterized by self-similarity, i.e., a small sections of the structure yields pieces with geometries that resemble the whole structure.
**These fractal patterns include (i) Koch, Peano, Hilbert lines, (ii) Moore, Vicsek loops, and (iii) Greek crosses.<ref>{{cite journal |last1=Fan |first1=Jonathan A. |last2=Yeo |first2=Woon-Hong |last3=Su |first3=Yewang |last4=Hattori |first4=Yoshiaki |last5=Lee |first5=Woosik |last6=Jung |first6=Sung-Young |last7=Zhang |first7=Yihui |last8=Liu |first8=Zhuangjian |last9=Cheng |first9=Huanyu |last10=Falgout |first10=Leo |last11=Bajema |first11=Mike |last12=Coleman |first12=Todd |last13=Gregoire |first13=Dan |last14=Larsen |first14=Ryan J. |last15=Huang |first15=Yonggang |last16=Rogers |first16=John A. |title=Fractal design concepts for stretchable electronics |journal=Nature Communications |date=7 February 2014 |volume=5 |issue=1 |page=3266 |doi=10.1038/ncomms4266 |pmid=24509865 }}</ref>