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Merged from revision 1293327654 of User:Abukaisar24/Design Automation and Test in Europe, whose sole substantial author is Abukaisar24 (talk); please see its page history for attribution. See also request by Abukaisar24 at WP:RMT. |
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DATE is a combination of a [[Academic conference|technical conference]] and a small [[trade show]]. It was formed in 1998 as a merger of EDAC, ETC, Euro-ASIC, and Euro-DAC.<ref>{{Cite book|url=https://worldcat.org/title/1112536591|title=Proceedings of the conference on Design, automation, and test in Europe (DATE 1998)
|date=1998|publisher=IEEE Computer Society|isbn=978-0-8186-8359-6|oclc=1112536591}}</ref>
== Areas of Submission ==
The DATE conference invites research papers in many areas related to [[electronic design automation]]. These topics are grouped into four main tracks: design methods, applications, testing, and embedded systems.<ref name="cfp">[https://www.date-conference.com/call-for-papers DATE Conference – Call for Papers]</ref>
'''Track D:<ref name="tpc-d">[https://www.date-conference.com/tpc Track D – DATE Technical Program Committee]</ref> [https://en.wikipedia.org/wiki/Design_methods Design Methods and Tools]''' covers research on how to build better design tools and methods. Topics include high-level synthesis, system simulation, formal verification, low-power and secure design, reconfigurable systems, and new ideas like quantum computing and approximate computing.
'''Track A:<ref name="tpc-a">[https://www.date-conference.com/tpc Track A – DATE Technical Program Committee]</ref> [https://en.wikipedia.org/wiki/Design_computing Application Design]'''focuses on real-world examples. It includes designs for smart energy systems, secure and autonomous systems, artificial intelligence, and new technologies used in practical ways.
'''Track T:<ref name="tpc-t">[https://www.date-conference.com/tpc Track T – DATE Technical Program Committee]</ref> [https://en.wikipedia.org/wiki/Dependability Test and Dependability]''' is about testing and reliability. It includes fault detection, circuit testing, secure system validation, and ways to make sure systems work even when there are errors.
'''Track E:<ref name="tpc-e">[https://www.date-conference.com/tpc Track E – DATE Technical Program Committee]</ref> [https://en.wikipedia.org/wiki/Embedded_system Embedded Systems Design]''' includes software and hardware for embedded and cyber-physical systems. Topics cover real-time systems, secure systems, software tools, and using machine learning in embedded devices.
Each track has several specific topics. Authors can choose the one that fits their work. All papers are peer-reviewed and must present original and useful research.
== Young People Programme ==
The DATE conference hosts the '''Young People Programme''', an initiative aimed at supporting early-career researchers and strengthening academic-industry connections. First introduced in 2019, the program offers career development resources for master’s students, PhD candidates, and postdoctoral researchers. It also provides a platform for companies and universities to engage with emerging talent. The programme includes networking events, mentorship opportunities, and recruiting activities to help participants explore career paths and build professional relationships.<ref name="ypp">[https://www.date-conference.com/young-people-programme DATE Conference – Young People Programme]</ref>
== Conference Archive ==
The following table lists past editions of the DATE (Design, Automation and Test in Europe) conference, including the host cities and years. A full archive of events and proceedings is available on the official DATE website.<ref name="archive">[https://www.date-conference.com/archive DATE Conference Archive]</ref> Additional bibliographic information is available through the DBLP computer science bibliography.<ref name="dblp">[https://dblp.org/db/conf/date/index.html DBLP – DATE Conference Proceedings Archive]</ref> Proceedings for each year are accessible via IEEE Xplore.<ref name="ieee">[https://ieeexplore.ieee.org/Xplore/home.jsp IEEE Xplore Digital Library]</ref>
{| class="wikitable sortable"
! Year !! Location !! Proceedings
|-
| 2025 || Lyon, France || [https://ieeexplore.ieee.org/xpl/conhome/10992638/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2024 || Valencia, Spain || [https://ieeexplore.ieee.org/xpl/conhome/10546498/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2023 || Antwerp, Belgium || [https://ieeexplore.ieee.org/xpl/conhome/10136870/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2022 || Antwerp, Belgium || [https://ieeexplore.ieee.org/xpl/conhome/9774496/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2021 || Grenoble, France || [https://ieeexplore.ieee.org/xpl/conhome/9473901/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2020 || Grenoble, France || [https://ieeexplore.ieee.org/xpl/conhome/9112295/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2019 || Florence, Italy || [https://ieeexplore.ieee.org/xpl/conhome/8704855/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2018 || Dresden, Germany || [https://ieeexplore.ieee.org/xpl/conhome/8337149/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2017 || Lausanne, Switzerland || [https://ieeexplore.ieee.org/xpl/conhome/7919927/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2016 || Dresden, Germany || [https://ieeexplore.ieee.org/xpl/conhome/7454909/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2015 || Grenoble, France || [https://ieeexplore.ieee.org/xpl/conhome/7076741/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2014 || Dresden, Germany || [https://ieeexplore.ieee.org/xpl/conhome/6784162/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2013 || Grenoble, France || [https://ieeexplore.ieee.org/xpl/conhome/6507370/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2012 || Dresden, Germany || [https://ieeexplore.ieee.org/xpl/conhome/6171057/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2011 || Grenoble, France || [https://ieeexplore.ieee.org/xpl/conhome/5754459/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2010 || Dresden, Germany || [https://ieeexplore.ieee.org/xpl/conhome/5450668/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2009 || Nice, France || [https://ieeexplore.ieee.org/xpl/conhome/4926138/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2008 || Munich, Germany || [https://ieeexplore.ieee.org/xpl/conhome/4475437/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2007 || Nice, France || [https://ieeexplore.ieee.org/xpl/conhome/4211748/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2006 || Munich, Germany || [https://ieeexplore.ieee.org/xpl/conhome/11014/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2005 || Munich, Germany || [https://ieeexplore.ieee.org/xpl/conhome/9609/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2004 || Paris, France || [https://ieeexplore.ieee.org/xpl/conhome/8959/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2003 || Munich, Germany || [https://ieeexplore.ieee.org/xpl/conhome/8443/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2002 || Paris, France || [https://ieeexplore.ieee.org/xpl/conhome/7834/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2001 || Munich, Germany || [https://ieeexplore.ieee.org/xpl/conhome/7307/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 2000 || Paris, France || [https://ieeexplore.ieee.org/xpl/conhome/6761/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 1999 || Munich, Germany || [https://ieeexplore.ieee.org/xpl/conhome/6133/proceeding IEEE Xplore]<ref name="ieee" />
|-
| 1998 || Paris, France || [https://ieeexplore.ieee.org/xpl/conhome/5270/proceeding IEEE Xplore]<ref name="ieee" />
|}
== Late Breaking Results ==
The DATE conference offers a special track for Late Breaking Results (LBR). This track allows researchers to share new ideas, early-stage findings, or innovative directions that are still in progress. LBR submissions are limited to two pages and must follow the official template. All submissions are reviewed through a blind peer-review process. Selected papers are presented in interactive sessions, where authors can receive feedback and discuss their work with the community.<ref name="cfp" />
== See also ==
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*[[Asia and South Pacific Design Automation Conference]]
*[[Symposia on VLSI Technology and Circuits]]
* [https://en.wikipedia.org/wiki/Design_methods Design methods] – Related to Track D: Design Methods and Tools
* [https://en.wikipedia.org/wiki/Design_computing Design computing] – Related to Track A: Application Design
* [https://en.wikipedia.org/wiki/Dependability Dependability] – Related to Track T: Test and Dependability
* [https://en.wikipedia.org/wiki/Embedded_system Embedded systems] – Related to Track E: Embedded Systems Design
==References==
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