Automatic test pattern generation: Difference between revisions

Revision as of 20:17, 13 July 2007

Revision as of 20:18, 13 July 2007

Line 22:

== ATPG and nanometer technologies ==

Historically, ATPG has focused on a set of faults derived from a gate-level fault model. As design trends move toward nanometer technology, new manufacture testing problems are emerging. During design validation, engineers can no longer ignore the effects of crosstalk and power supply noise on reliability and performance. Current fault modeling and vector-generation techniques mustare givegiving way to new models and techniques that consider timing information during test generation, that are scalable to larger designs, and that can capture extreme design conditions. For nanometer technology, many current design validation problems are becoming manufacturing test problems as well, so new fault-modeling and ATPG techniques will be needed.

== Algorithmic Methods ==