Automatic test pattern generation: Difference between revisions

Revision as of 00:12, 11 October 2007

Revision as of 18:41, 19 October 2007

Line 40:

* [[ASIC]]

* [[VHSIC]]

{{EDASeeAlso}}

From http://pico1.e.ft.fontys.nl/publicad.html the simple serial fault simulator '''Faultsim''', intended for educational purposes, that is part of the '''Publicad''' design kit, can be downloaded free of charge.