Automatic test pattern generation: Difference between revisions

Revision as of 14:03, 21 November 2003

Revision as of 01:08, 4 December 2003

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after they are produced.

Testing [[Veryvery-Largelarge-Scalescale Integrationintegration|very -large -scale integrated]] circuits with a high [[fault coverage]] is a hard task because of their complexity.

Different ATPG methods have to be applied to [[Combinatorial logic|combinatorial]] and [[Sequential logic|sequential]] circuits.