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Line 1: '''Design for Test''' refers to the act of adding special "test" circuits to a chip design (usually digital) for the sole purpose of testing the manufactured device for defects. The most common method for adding this test is called scan-design, where registers (flip-flops) in the design are connected in a chain, and used to gain access to internal nodes of the chip. Test patterns are shifted in and results shifted out. == See also == * [[JTAG]]

Design for testing: Difference between revisions