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== Introduction ==
'''Automatic test pattern generation (ATPG)''' systems are tools for generating tests for [[digital circuit]]s
after they are produced.
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Different ATPG methods have to be applied to [[Combinatorial logic|combinatorial]] and [[Sequential logic|sequential]] circuits.
'''Psuedorandom test generation''' is the simplest method of creating tests. It uses a [[pseudorandom]] number generator to generate test vectors.
See also:▼
== Algorithmic Methods ==
Several computer generated methods to create test patterns have been created.
* Early test generation algorithms such as [[boolean difference]] and [[literal proposition]] were not practical to implement on a computer.
* The '''D Algorithm''' was the first practical test generation [[algorithm]] in terms of memory requirements. The D Algorithm introduced '''D Notation''' which continues to be used in most ATPG algorithms.
* '''Path Oriented Decision Making''' ([[PODEM]]) is an improvement over the D Algorithm. PODEM was created in 1981 when shortcomings in D Algorithm became evident when design innovations resulted in circuits that D Algorithm could not realize.
* '''Fan-Out Oriented''' ([[FAN]]) is an improvement over PODEM. It limits the ATPG search space to reduce computation time and accelerates backtracing.
* [[Design for Test]] (DFT)
* [[Fault model]]
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