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== Scan design ==
The most common method for delivering test data from chip inputs to internal ''circuits under test'' (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ([[Flip-flop (electronics)|flip-flop]]s or [[Latch (electronic)|latches]]) in the design are connected in one or more [[scan chain]]s, which are used to gain access to internal nodes of the chip. Test patterns are shifted in via the scan chain(s), functional [[clock signal]]s are pulsed to test the circuit during the "capture cycle(s)", and the results are then shifted out to chip output pins and compared against the expected "good machine" results.
Straightfoward application of scan techniques can result in large vector sets with corresponding long tester time and memory requirements. [[Test compression]] techniques address this problem, by decompressing the scan input on chip and compressing the test output. Large gains are possible since any particular test vector usually only needs to set and/or examine a small fraction of the scan chain bits.
== Debug using DFT features ==
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