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The easiest way to obtain modulation is modulation of intensity of a light by the current driving the light source ([[laser diode]]). This sort of modulation is called direct modulation, as opposed to the external modulation performed by a light modulator. For this reason, light modulators are called external light modulators.
According to manipulation of the properties of material modulators are divided into two groups, absorptive modulators ([[absorption coefficient]]) and refractive modulators ([[refractive index]] of the material). [[Absorption coefficient]] can be manipulated by Franz-Keldysh effect, Quantum-Confined [[Stark Effect]],
=== Electro-optic modulator ===
An electro-optic modulator is a device which can be used for controlling the power, phase or polarization of a laser beam with an electrical control signal. It typically contains one or two [[
The crystal which is covered by electrode may be considered to be a voltage-variable wave-plate. When a voltage is applied, the retardation of laser polarization of the light would be changed while a beam passes through an
• large change in [[refractive index]] per volt
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• low dielectric loss tangent (no dielectric heating due to a high-frequency electric field)
• no distortions in modulators output from
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Acousto-optic modulators are used to vary and control laser beam intensity. A Bragg configuration gives a single first order output beam, whose intensity is directly linked to the power of RF control signal. The rise time of the modulator is simply deduced by the necessary time for the acoustic wave to travel through the laser beam. For highest speeds the laser beam will be focused down, forming a beam waist as it passes through the modulator.
In an AOM a laser beam is caused to interact with a high frequency
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Optical modulators can be implemented using Semiconductor Nano-structures to increase the performance like high operation, high stability, high speed response, and highly compact system. Highly compact electro-optical modulators have been demonstrated in compound semiconductors.<ref>Sadagopan, T., Choi, S. J., Dapkus, P. D. & Bond, A. E. Digest of the LEOS Summer Topical Meetings MC2–-3 (IEEE, Piscataway, New Jersey (2004)</ref> However, in silicon, electro-optical modulation has been demonstrated only in large structures, and is therefore inappropriate for effective on-chip
integration. Electro-optical control of light on silicon is challenging owing to its weak electro-optical properties. The large dimensions of previously demonstrated structures were necessary to achieve a significant modulation of the transmission in spite of the small change of refractive index of silicon. Liu et al. have recently demonstrated a high-speed silicon optical modulator based on a metal–oxide–semiconductor (MOS) configuration<ref>Liu, A. et al. Nature 427, 615–618 (2004)</ref>. Their work showed a high-speed optical active device on silicon—acritical milestone towards [[optoelectronic
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Acoustic [[solitons]] strongly influence the electron states in a semiconductor nanostructure. The amplitude of [[soliton]] pulses is so high that the electron states in a [[quantum well]] make temporal excursions in energy up to 10 meV. The subpicosecond duration of the [[solitons]] is less than the coherence time of the optical transition between the electron states and a frequency modulation of emitted light during the coherence time (chirping effect) is observed. This system is for an ultrafast control of electron states in semiconductor nanostructures.
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A schematic diagram of the MO modulator is shown in Fig. 1. The MO active layer is a 4.5 μm (Y0.6Bi0.4LuPr)3(FeGa)5O12 film that has been grown on a 450-μm thick (1 1 1)-oriented gadolinium gallium garnet substrate by means of liquid-phase epitaxy. The MO film has an in-plane magnetization with a saturation value (μ0Ms) of 9 mT and a specific [[Faraday rotation]] of 5400°/cm at 800 nm. A linearly polarized optical beam from an 800 nm [[laser diode]] is focused and edge-coupled to the thin film waveguide. At this wavelength the optical absorption of the MO film is 400 cm−1 and, therefore, the length of the device is designed to be 60 μm. On the surface of the Bi-YIG film, a 50-Ω terminated microstrip transmission line is patterned and used to carry the high-speed electrical signals, I(t). The current transient creates a time-varying magnetic field that has a component, bz(t), along the direction of optical propagation. This component (underneath the microstrip line) acts to tip the magnetization, M, along the propagation direction of the optical beam. A static in-plane magnetic field, by, is applied perpendicular to the light propagation direction, thus ensuring the return of M to its initial orientation after the passage of the current transient. Depending on the component of the magnetization along the z-direction, Mz, the optical beam experiences a rotation of its polarization due to the Faraday effect. The polarization modulation is converted into an intensity modulation via a
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