Random test generator: Difference between revisions

Revision as of 03:16, 24 June 2009

Revision as of 14:34, 8 September 2009

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'''Random test generators''' (often abbreviated RTG) are a subset of [[Generator_(computer_science)|generators]] that are used in [[Functional_verification|functional verification]] of microprocessors. Their primary use lies in providing input stimulus to a [[Device_under_test|device under test]].

In a [[Logic_simulation|simulation]] / [[Testbench|testbench]] verification environment, the simulator processes input created by the RTG and coverage monitors may used to verify that the generator is properly testing the design.

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* [http://ieeexplore.ieee.org/Xplore/login.jsp?url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F9501%2F30140%2F01383278.pdf%3Farnumber%3D1383278&authDecision=-203 IEEE article - A universal random test generator for functional verification of microprocessors and system-on-chip]

[[Category:Electronic circuit verification]]

{{Uncategorized|date=June 2009}}