Restricted randomization: Difference between revisions

Revision as of 21:58, 2 October 2010

Revision as of 23:48, 23 December 2010

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{{Cleanup|date=June 2009}}

{{Intro-Lead rewrite|date=September 2009}}

Many [[process (engineering)|processes]] have more than one source of [[statistical dispersion|variation]] in them. In order to [[variance reduction|reduce variation]] in processes, these multiple sources must be understood, and that often leads to the concept of nested or hierarchical data structures. For example, in the semiconductor industry, a [[batch production|batch process]] may operate on several [[wafer (electronics)|wafers]] at a time (wafers are said to be '''nested''' within batch). Understanding the input variables that control variation among those wafers, as well as understanding the variation across each wafer in a run, is an important part of the strategy for minimizing the total variation in the system.

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{{NIST-PD}}

{{DEFAULTSORT:Restricted Randomization}}

[[Category:Analysis of variance]]

[[Category:Experimental design]]