Standard Test Data Format: Difference between revisions

Revision as of 13:24, 11 October 2010

Revision as of 00:52, 25 January 2011

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'''Standard Test Data Format''' ('''STDF''') is a proprietary [[file format]] for [[semiconductor]] test information originally developed by [[Teradyne]], but now widely used [[de facto standard|de facto]] throughout the semiconductor industry. It is a commonly used format produced by [[Automatic Test Equipment]] (ATE) platforms from leading companies such as Teradyne, [[VerigyLTX-Credence_Corporation|LTX - Credence Corporation]], [[LTXRoos Instruments]], [[CredenceTeradyne]], Systems|Credence[[Verigy]], and others.

STDF is a [[binary file|binary]] format, but can be converted either to an [[ASCII]] format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data format to extract ASCII text is non-trivial as it involves a detailed comprehension of the STDF specification, the current (2007) version 4 specification being over 100 pages in length. Software tools exist for processing STDF generated files and performing [[statistical analysis]] on a population of [[device under test|tested devices]].