Reliability prediction for electronic components: Difference between revisions

Revision as of 21:28, 5 April 2011

Revision as of 10:35, 7 May 2011

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Every product has a [[failure rate]], λ which is the number of units failing per unit time. This failure rate changes throughout the life of the product. It is the manufacturer’s aim to ensure that product in the “[[infant mortality]] period” does not get to the customer. This leaves a product with a useful life period during which failures occur randomly i.e., λ is constant, and finally a wear-out period, usually beyond the products useful life, where λ is increasing.

=== Definition of Reliability ===

A practical definition of reliability is “the [[probability]] that a piece of equipment operating under specified conditions shall perform satisfactorily for a given period of time”. The reliability is a number between 0 and 1.

=== MTBF and MTTF ===

[[MTBF]] (mean operating time between failures) applies to equipment that is going to be repaired and returned to service, MTTF (mean time to failure) applies to parts that will be thrown away on failing. During the ‘useful life period’ assuming a constant failure rate, MTBF is the inverse of the failure rate and the terms can be used interchangeably

=== Importance of Reliability Prediction ===

Reliability predictions:

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The RPP views electronic systems as hierarchical assemblies. Systems are constructed from units that, in turn, are constructed from devices. The methods presented predict reliability at these three hierarchical levels:

:# ''Device'': A basic component (or part)

:# ''Unit'': Any assembly of devices. This may include, but is not limited to, circuit packs, modules, plug-in units, racks, power supplies, and ancillary equipment. Unless otherwise dictated by maintenance considerations, a unit will usually be the lowest level of replaceable assemblies/devices. The RPP is aimed primarily at reliability prediction of units.

:# ''Serial System'': Any assembly of units for which the failure of any single unit will cause a failure of the system.

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