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|expert=March 2012}}
In statistics, '''restricted randomization''' occurs in [[experimental design]]s with more than one source of [[statistical dispersion|variability]].
In order to [[variance reduction|reduce variation]] in processes, these multiple sources must be understood, and that often leads to the concept of nested or hierarchical data structures. For example, in the [[semiconductor]] industry, a [[batch production|batch process]] may operate on several [[wafer (electronics)|wafers]] at a time (wafers are said to be '''nested''' within batch). Understanding the input variables that control variation among those wafers, as well as understanding the variation across each wafer in a run, is an important part of the strategy for minimizing the total variation in the system.
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==External links==
{{Statistics}}
{{Experimental design}}
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